Date Feb 22, 2023, 12:00 pm – 1:00 pm Location Bowen Hall Auditorium 222 Details Event Description Nanoscale X-ray Imaging: Why and How Abstract: Compared to electrons and visible light, x-rays have a much deeper penetrating power into materials. The strong penetration power, in conjunction with the wavelength at the atomic scale, makes x-rays useful for a broad spectrum of applications from 3D imaging to crystallography and spectroscopy. On the other hand, the weak interaction of x-rays with matter, responsible for the excellent penetrating property, makes it extremely difficult to produce x-ray lenses required for building x-ray microscopes with nanometer resolution. The presentation will focus on how a high brightness x-ray source like NSLS-II is needed to build powerful x-ray microscopes and how these microscopes are used for performing cutting-edge x-ray imaging experiments. Bio: Yong Chu is a beamline scientist at the National Synchrotron Light Source II within the Brookhaven National Laboratory. He also serves as the program manager for the imaging and microscopy beamlines at NSLS-II, managing the operation of five beamlines with active general user programs. Yong received a B.S. degree in physics from the California Institute of Technology in 1989 and a Ph.D. in physics from the University of Illinois at Urbana-Champaign in 1997. After completing his postdoctoral training, Yong worked as a beamline scientist at the Advanced Photon Source near Chicago. In 2009, he took a physicist position at Brookhaven National Laboratory to lead the designing and construction of the Hard X-ray Nanoprobe Beamline, which still holds the record of the highest x-ray imaging resolution since its first operation in 2014. Yong’s expertise includes x-ray imaging, x-ray optics, x-ray diffraction, and synchrotron instrumentation. All seminars are held on Wednesdays from 12:00 noon-1:00 p.m. in the Bowen Hall Auditorium Room 222. A light lunch is provided at 11:30 a.m. in the Bowen Hall Atrium immediately prior to the seminar.